提高瞬態(tài)電流測試自動(dòng)測試生成時(shí)間效率的方法及全速電流模擬.pdf

1、湖南大學(xué)碩士學(xué)位論文提高瞬態(tài)電流測試自動(dòng)測試生成時(shí)間效率的方法及全速電流模擬姓名：張鑫申請學(xué)位級別：碩士專業(yè)：通信與信息系統(tǒng)指導(dǎo)教師：鄺繼順20050601提高瞬態(tài)電流測試白動(dòng)測試生成時(shí)間效率的方法及全速電流模擬IntegratedCircuit(ic)testingiscriticalforhighqualityICsandhighyieldofICproductionTestingbasedonstuckatfaultmodelis

2、insufficientforhighperformanceICs，especiallyforCMOScircuitsQuiescentpowersupplycurrent(IDDQ)testinghasbecomeanacceptedtestmethodbytheICindustrysincetheideawasproposedinearly1980’sUsingIDDQtestingcanreducethecostoftesting

3、andenhancethereliabilityofthechipremarkablyHowever，somedefects，suchassomestuckopendefectsinCMOSICsstillcannotbedetectedbyIDDQtestingorbylogictesting，andatthesametimeitfacedsomechallengesofincreasingleakelectriccurrentind

4、eepsubmicrotechnologyDuetotheselimitations，inordertoimprovethefaultcoverageofthetestingtomeetthedemandsofpeople，thedynamiccurrent(IDDT)testingwasproposedtodetectsomefaultsthatcannotbedetectedbyothertestingmethodsIttakest

5、oomuchoftimeintotaltogenerateatestpatternforeachfault，andwhichisnotnecessarysinceacertainrelationexistsbetweenthetroublesofcircuit，suchasrelationof”equivalence”andrelationof’’domination”whichcanbedetectedbythesametestpat

6、ternThispaperfocusesonhowtoreducethenumberofstuckopenfaultsdetectedbydynamiccurrenttesttechniqueforenhancingtheautotestpatterngeneration(ATPG)efficiencyThiscanbedoneinthewaythatnearerthesiteofafaulttotheprimaryoutputsoft

7、hecircuitundertest，earliertheautotestpatterngeneration(ATPG)forthisfaultstarts，andadjustthecontrolcostparameterdynamicallyandreversetheorderoftestpattern，Withthepremiseofkeeping”robust”oftheoriginalalgorithm，usingthismet

8、hodcanreducethenumberofthefaultsandenhancethetimeefficiencyofATPGobviouslyExperimentalresultsshowthatabout70％ofATPGtimeiscutdownInaddition，inordertoverifytheemciencyofATPo，awaveformsimulatorhasbeenmodified，whichcanmakeit

9、todetectfaultswhengatedelaysareassignedintherangeof10％oftheirnominalvaluesThegatedelayswhichwereusedsatisfiednormaldistributionExperimentalresultsprovedthattheATPGalgorithmiseffective，F(xiàn)inally，inordertoverifythefeasibilit

10、yofat—speedcurrenttesting，byusingPSPICEsoftware，somefaultswerebeensimulatedforC432，whichincludedopenfault，stuckfaultandredundantfault。Itshowsthatthedistinctionbetweenfaultfreecircuitandfaultycircuitislarge，whichfullyprov