en-9934-3磁粉探傷標(biāo)準(zhǔn)

1、1磁粉探傷標(biāo)準(zhǔn)：磁粉探傷標(biāo)準(zhǔn)：ISOEN99343部分部分3——檢驗(yàn)設(shè)備檢驗(yàn)設(shè)備Contents內(nèi)容內(nèi)容Fewd前言前言.......................................................................................................................31Scope范圍范圍..............................

2、........................................................................42Nmativereferences規(guī)定參考規(guī)定參考......................................................................................43Safetyrequirements安全要求安全要求.......

3、......................................................................................44Typesofdevices設(shè)備的類(lèi)型設(shè)備的類(lèi)型..................................................................................44.1Ptableelectromags(AC)便

4、攜式的電磁體.............................................................44.2Currentgenerats電流發(fā)電器......................................................................................64.3Magicbenches磁性長(zhǎng)條磁性長(zhǎng)條...................

5、...................................................................84.4Specializedtestingsystems特殊檢驗(yàn)系統(tǒng)特殊檢驗(yàn)系統(tǒng)......................................................................105UVAsources..UVA光源光源....................

6、....................................................................115.1Generals一般一般..........................................................................................................115.2Technicaldata技術(shù)參數(shù)技術(shù)參數(shù)...

7、.......................................................................115.3Minimumrequirements最小要求最小要求.......................................................................116Detectionmediasystem檢驗(yàn)介質(zhì)系統(tǒng)檢驗(yàn)介質(zhì)系統(tǒng)...........

8、.........................................................126.1General一般一般........................................................................126.2Technicaldata技術(shù)參數(shù)技術(shù)參數(shù).................................................

9、................126.3Minimumrequirements最小要求最小要求..................................................................127Inspectionbooth檢驗(yàn)臺(tái)檢驗(yàn)臺(tái).......................................................127.1General.一般一般..........

10、............................................................................................127.2Technicaldata技術(shù)參數(shù)技術(shù)參數(shù)........................................................................127.3Minimumrequirements最小要求最小

11、要求..............................................................138Demagization.去磁去磁.....................................................................138.1General一般一般...................................................

12、..................138.2Technicaldata技術(shù)參數(shù)技術(shù)參數(shù)...........................................................138.3Minimumrequirements最小要求最小要求........................................................139Measurements.測(cè)量測(cè)量.........

13、....................................................................139.1General一般一般........................................................................139.2Currentmeasurement.電流測(cè)量電流測(cè)量................................

14、.......................................149.3Magicfieldmeasurement.磁性區(qū)域測(cè)量磁性區(qū)域測(cè)量......................................................149.4Visiblelightmeasurement可視光測(cè)量可視光測(cè)量..................................................

15、....................149.5UVAirradiancemeasurement..UVA照射測(cè)量照射測(cè)量...................................159.6Verificationcalibrationofinstruments儀器的證明和標(biāo)定儀器的證明和標(biāo)定..........................................15Bibliography術(shù)語(yǔ)術(shù)語(yǔ)......

16、....................................................................................1ScopeThisEuropeanStarddescribesthreetypesofequipmentfmagicparticletesting:這個(gè)標(biāo)準(zhǔn)是對(duì)三種磁粉探傷設(shè)備類(lèi)型的描述??ptabletransptableequipment便攜式或可移動(dòng)的設(shè)備??fi

17、xedinstallations固定的設(shè)施??specializedtestingsystemsftestingcomponentsonacontinuousbasiscomprisingaseriesofprocessingstationsplacedinsequencetofmaprocessline.專(zhuān)業(yè)的檢測(cè)系統(tǒng)來(lái)檢驗(yàn)一個(gè)連續(xù)基準(zhǔn)上的元件，包括一系列處理的位置區(qū)域所形成的線(xiàn)性裂紋。3Hheldptableelectromags(

18、yokes)produceamagicfieldbetweenthetwopoles.手扶的便攜式的電磁體（軛）在兩個(gè)桿之間產(chǎn)生一個(gè)磁性區(qū)域。(WhentestingaccdingtoENISO99341DCelectromagsshouldonlybeusedifagreedatenquiryderstages).（當(dāng)按照ENISO99341進(jìn)行試驗(yàn)時(shí)，DC電磁體只有在詢(xún)問(wèn)和定單階段同意的情況下才可以應(yīng)用。）Magizationsha

19、llbedeterminedbymeasuringthetangentialfieldstrengthHtatthecentreofalinejoiningthecentresofthepolefacesoftheelectromagwithpoleextenderswhereused.磁化應(yīng)當(dāng)被確定由測(cè)量帶一個(gè)延長(zhǎng)桿的電磁鐵桿面的線(xiàn)性中心的切向應(yīng)力。Theelectromagwithapolespacingsisplacedonast

20、eelplateasshowninFigure1.帶一個(gè)桿間距的電磁鐵被放置在一個(gè)鋼板上如圖一所示。Theplateshallhavethedimensions鋼板尺寸(500??25)mmx(250??13)mmx(10??0.5)mmshallbeofsteelconfmingtoC22(EN10084)..應(yīng)當(dāng)符合C22(EN10084)。Periodicfunctionalchecksmaybecarriedouteitherb

21、ythemethoddescribedabovebyalifttest.周期性功能檢查可以通過(guò)以上描述的方法或通過(guò)一個(gè)推力試驗(yàn)實(shí)施。TheelectromagshallbecapableofsupptingasteelplaterectangularbarconfmingtoC22(EN10084)havingaminimummassof45kgwiththemagpolessetattheirrecommendedspacing.電磁

22、鐵應(yīng)當(dāng)可以支持一個(gè)鋼板或長(zhǎng)方形臺(tái)子符合C22(EN10084)和有一個(gè)最小的質(zhì)量4.5KG、用一個(gè)磁性桿設(shè)置在它們推薦的空間。Themajdimensionoftheplatebarshallbegreaterthanthepolespacingsoftheelectromag鋼板和臺(tái)子的主要尺寸應(yīng)當(dāng)大于磁鐵的桿間距。NOTE:Toliftasteelplatewithamassof45kgrequiresaliftingfceof44