電磁脈沖對(duì)屏蔽機(jī)箱孔縫耦合及毀傷效應(yīng)研究.pdf

1、南京理工大學(xué)碩士學(xué)位論文電磁脈沖對(duì)屏蔽機(jī)箱孔縫耦合及毀傷效應(yīng)研究姓名：張茂磊申請(qǐng)學(xué)位級(jí)別：碩士專(zhuān)業(yè)：火炮、自動(dòng)武器與彈藥工程指導(dǎo)教師：曹兵20090525Abstract碩士論文AbstractElectromagneticpulse(EMP)canbeproducedbynuclearexplosions，lightening，highpowermicrowavebomb，electromagneticpulsebombsandoth

2、ermethods，whichcandamageelectronicequipmentforradarcommunicationssystemsandweaponssystemsForexample，electromagneticpulsecandamagethecrystaldiodes，transistors，integratedcircuits，resistors，capacitors，filters，relaysandother

3、componentsusedinelectronicequipmentsElectromagneticpulse(EMP)actsonshieldingboxprimarilythroughconductioncouplingandradiationcouplingCouplingpathmainlyincludes”front—doorcoupling”and”back—doorcoupling“The”frontdoorcoupli

4、ng”referstothatelectromagneticpulseinterfereswithordamagesthefrontendelectronicequipmentthroughsuchastheantennasandtransmissionlines，whichareusedonthesystems；The”backdoorcoupling”referstothatelectromagneticpulseinterfere

5、swithordamagesintegratedcircuitsandmicroelectronicdevicesusedinelectronicequipmentthroughaperturesandslotsusedinthesystemsThecouplingenergythroughthe”front—doorcoupling”maybeseparatedbysystem’Sprotectiondevices，whichwill

6、notinterferewithordamagesysteansThevariousfunctionsoftheaperturesareessentialtotheshieldingboxElectromagneticpulsecouplesintotheshieldingboxthroughthe”back—doorcoupling“whichinevitablyinterfereswithordamagestheelectronic

7、componentsusedintheshieldingboxThe”back—doorcoupling”isoneoftheimportantwaystocoupleintotheshieldingboxThemainstudiesandgoalsinthispaperaresimulationstudiesofEMPaperturecouplinganddamageeffectsThemainstudiesandgoalsinthi

8、spaperareasfollowsInfrequencydomain，weusethesoftwareHFSS，whichiSbasedonfiniteelementmethod，tosimulatetheresonantfrequencyofshieldingboxeswithdifferentdimensions，influencesofslotsonshieldeffectiveness，，etcIntimedomain，weu

9、sethesoftwareXFDTD，whichisbasedonFinite—DifferentTime—Domain，tosimulateinfluencesofrisetimeandpulsewidthoncoupling，enhancementeffect，influencesofPCBonaperturecoupling，damageeffectofEMPtotheshieldingbox，influencesofriseti